The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 1987

Filed:

Aug. 29, 1985
Applicant:
Inventors:

Toshiaki Kakii, Kanagawa, JP;

Koichiro Matsuno, Kanagawa, JP;

Osamu Kawada, Ibaraki, JP;

Ryozo Ito, Kanagawa, JP;

Eiji Nakamura, Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
350511 ;
Abstract

In order to simultaneously observe a transparent object from two directions, first and second beam paths containing first and second images from two directions are separated using a prism to reflect the second beam path yet pass the first beam path. The length of the second beam path is caused to be different from that of the first beam path. Then the first and second beam paths are combined so that the first and second images may be viewed simultaneously. The different beam path lengths result in the first and second images being formed at the same position. As a result, the images carried by the first and second beam paths, both passing through a single objective lens, may be viewed simultaneously at a single location.


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