The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 1987

Filed:

Mar. 04, 1985
Applicant:
Inventor:

Johannes H den Boef, Eindhoven, NL;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324309 ; 324312 ;
Abstract

NMR images formed by means of Fourier zeugmatography contain disturbing artefacts which are caused by coherent interference signals (for example, offset signals, non-ideal 180.degree. reversing pulses). In accordance with the invention, alternating phase (90.degree.) excitation pulses are used in the successive measurement cycles and the signal samples taken during the measurement cycles are stored in adjacent rows of an image frequency matrix. The values in every second row of the matrix are inverted, so that the contributions of the coherent interference signals change their sign in every row in the direction of the columns. During the Fourier transformation of the columns, therefore the artefacts caused by the interference signals are shifted towards the edge of the image.


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