The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 1987
Filed:
Sep. 19, 1985
Tsuneyuki Egami, Gamagori, JP;
Tsutomu Saito, Okazaki, JP;
Mitosi Ando, Nishio, JP;
Ryuzou Hori, Toyota, JP;
Takashi Kamo, Toyota, JP;
Kazunori Yoshida, Okazaki, JP;
Nippon Soken, Inc., Nishio, JP;
Toyota Jidosha Kabushiki Kaisha, Toyota, JP;
Abstract
A coating quality measuring device and a pattern plate including one reference pattern portion having a large pattern width and a plurality of strip pattern portions each having a smaller pattern width. The pattern plate is disposed opposite the coated surface. The pattern plate is reflected off the coated surface and a reflected image is formed on an image sensor. The image sensor successively outputs signals each corresponding to the light level of each strip pattern portion on a line extending in a width direction of each strip pattern portion of the reflected image. A computing device calculates an average signal level of the signals outputted by the image sensor, divides the difference between the average signal level and the signal level of each signal by the signal level of the reference pattern portion and calculates a square average value of the obtained division value to obtain a measure of the coating quality of the coated surface.