The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 1987
Filed:
Mar. 28, 1985
Applicant:
Inventors:
Alfred J Heidinger, Chester, NJ (US);
Robert W Duyckinck, New Providence, NJ (US);
Assignee:
Mikropul Corporation, Summit, NJ (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B07B / ;
U.S. Cl.
CPC ...
209380 ; 209358 ; 406 89 ; 366101 ; 222195 ;
Abstract
Improved sieving apparatus for size analysis of dry powder having a sample chamber floored by a sieving screen and an underlying fines chamber adapted to be mated in fluid communication therewith. Disposed beneath the screen is a jet emitting rotor of selective configuration adapted to emit an upwardly directed air jet curtain to repeatedly sweep the underside of the screen to both improve the screening action and to reduce the required time therefore.
Heidinger, Alfred. (1987). Analytic sieving apparatus (U.S. Patent No. 4681676). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4681676
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile