The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 1987
Filed:
Mar. 25, 1985
Ronald D Wertz, Boulder, CO (US);
Ball Corporation, Muncie, IN (US);
Abstract
A method and apparatus is disclosed for stabilizing the operative angle of acceptance of a multiple-beam interferometer means that is employed in an optical measuring system wherein optical radiation source means are employed. In accordance with the disclosed apparatus, the optical radiation source means is utilized to provide a reference point optical radiation source which emits reference optical radiation that is received by the multiple-beam interferometer means. With respect to such reference optical radiation, a set of reference non-localized multiple-beam interference fringes are created by the interferometer means. A photoelectric detection means is provided to detect the two-dimensional position of at least a portion of the innermost interference fringe of the reference set of interference fringes. Such positional information is transmitted by electrical signals to a processor means which compares such signals to desired values therefor. The desired values reflect what size said detected innermost fringe should be if the multiple-beam interferometer means is operating at a predetermined and desired angle of acceptance. If deviations from such desired values are discerned by the processor means, the processor means will transmit a control signal to the optical radiation source means. The control signal will instruct the optical radiation source means to vary the wavelength of the radiation emitted thereby so as to cause the operative angle of acceptance of the interferometer means to stabilize about the desired value therefor.