The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 1987

Filed:

Oct. 19, 1984
Applicant:
Inventors:

Siv Chang Tan, Paris, FR;

Tri Hue Nguyen, Le Pre St. Gervais, FR;

Claude Benchimol, Paris, FR;

Assignee:

Thomson-CSF, Paris, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
378-4 ; 378 19 ;
Abstract

An image acquisition and reconstruction process for increasing the definition of the radiological image obtained by tomodensitometry. The invention consists in taking two series of data or 'views' and in arranging this data by causing the views W.sub.i of the second series to undergo a translation of --.pi..theta. and a symmetry --.gamma., in the space [.theta.,.gamma.], .theta. being equal to .beta.+.gamma.; .gamma. designates the angle between the different detectors and the straightline joining the origin of the fan-shaped X ray beam to the center of rotation of the source-detectors assembly and .beta. represents the different angles of the source-detectors assembly at which acquisition of the views is made.


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