The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 1987

Filed:

Jan. 15, 1985
Applicant:
Inventors:

G Conrad Dalman, Ithaca, NY (US);

Hiroshi Kondoh, Ithaca, NY (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324 / ; 324 / ; 324 / ;
Abstract

A vector network analyzer system for measuring the complex impedance of devices and components at millimeter wavelengths is disclosed. A pair of directional couplers provide samples of the signal incident on and reflected from the element under test through reference and test channels, respectively. A 180.degree. hybrid, or magic tee, device receives the samples, mixes them vectorially, and produces outputs to two power detectors which provide amplitude and phase information about the complex reflection coefficient. Similar measurements are obtained for the complex transmission coefficient. A 90.degree. phase shifter consisting of a second magic tee and a PIN diode is connected in the reference channel to eliminate a phase measurement ambiguity. A computer processes the power detector output to determine the value of the unknown impedence. An electronically swept signal source allows measurements to be made automatically over a wide frequency band.


Find Patent Forward Citations

Dalman, G. (1987). Millimeter wave vector network analyzer (U.S. Patent No. 4680538). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4680538

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…