The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 1987
Filed:
Sep. 09, 1985
Milton E Fuller, Reno, NV (US);
Gary S Fletcher, Jr, Citrus Heights, CA (US);
Other;
Abstract
An apparatus and method for measuring the concentration of a chemical substance in a test sample based on a technique of waveform distortion analysis is disclosed. The apparatus includes a waveform generator that generates a periodic signal, an antenna probe that transmits the signal into the test sample and receives from the test sample a corresponding periodic signal, the waveform of which has been distorted or otherwise transformed by the chemical, and a detector circuit that quantifies the transformation of the signal to determine the concentration of the chemical in the test sample. The waveform shape and frequency are selected so that the transformation is particularly responsive to the presence of a selected chemical substance, so that the magnitude of the distortion or transformation of the signal is directly related to the concentration of the selected chemical substance.