The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 1987

Filed:

Aug. 26, 1985
Applicant:
Inventor:

Harry S Koontz, Penn Hill, PA (US);

Assignee:

PPG Industries, Inc., Pittsburgh, PA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
33551 ; 33 / ; 33503 ;
Abstract

An inspection apparatus includes a checking fixture having an article supporting surface having a contour representative of the desired/ideal peripheral marginal edge contour of a contoured article to be inspected, such as a bent glass sheet, e.g. an automotive lite. The article is supported by the article supporting surface of the fixture. The apparatus further includes position-sensing facilities, e.g. a linear potentiometer, and facilitates, e.g. a robot, for moving the potentiometer about the periphery of the article to be inspected, to generate a plurality of signals indicative of the gap between a plurality of predetermined points around the marginal edge periphery of the article supporting surface and a corresponding plurality of points around the marginal edge periphery of the article. The apparatus further preferably includes a computer or the like for processing the generated signals to provide information about the contour characteristics of the article, e.g. bend, sag, kink, or the like. Also disclosed herein is a method for using the apparatus of this invention.


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