The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 1987
Filed:
Apr. 29, 1985
Reade Williams, South Hamilton, MA (US);
Kenneth P Westlund, Danvers, MA (US);
Emhart Industries, Inc., Farmington, CT (US);
Abstract
Method and apparatus for inspecting transparent articles such as glassware for various types of defects, while conveying the articles past an optical inspection assembly. An article to be inspected is transported through an inspection station where it may undergo rotational and translational motion while being illuminated during an inspection interval. The inspection apparatus includes a video camera which provides output signals representative of the luminance of image elements, and video processing circuitry to derive line sum signals representative of the aggregate luminance of preselected scan lines. The line sum signals are further processed to discriminate streaks of brighter-than-normal or darker-than-normal pixels in a series of image frames. The user may establish window parameters to define an area of the article to be scanned for defects.