The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 1987
Filed:
Mar. 21, 1985
Eugene Constant, Villeneuve d'Ascq, FR;
Yves Leroy, Villeneuve d'Ascq, FR;
Jean-Claude Van De Velde, Mons-en-Baroeul, FR;
Centre National de la Recherche Scientifique, Paris, FR;
Abstract
The invention relates to an impedance adaptation control process in low noise reception chains and a miniature microwave thermometer of application of the said process. The process is used mainly in order to measure internal temperature by microwave thermography. The thermal radiation is picked up by means of an aerial (1) which provides a signal (2). This signal (2) is sent alternatively with a signal (5) coming from a standard source to a hyperfrequency amplifier (3) in order to compare the said signals (2,5) and to adjust the source (4) in consequence. According to the invention, in parallel, an additional impedance (15) is placed by intermittance in parallel to the input of the amplifier (3). By means of a synchronous detection (18) of the resulting signal (7), the impedance of the standard source (4) is adjusted so as to equal that of the aerial (1). The invention would, in particular, be applied for gauging the instruments for measuring the noise of dipoles and quadripoles such as microwave thermography.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile