The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 1987
Filed:
Dec. 19, 1985
Applicant:
Inventors:
Louis F Coffin, Jr, Schenectady, NY (US);
Thomas A Prater, Schenectady, NY (US);
Assignee:
Electric Power Research Institute, Inc., Palo Alto, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73799 ;
Abstract
A method is provided for measuring crack growth within a material utilizing reversing d.c. potential measurements across a preformed crack. Preferably, the material is representative of structural components of interest and the material is located within the aggressive environment of such components. The measured values are plotted versus distance to obtain intercept values. These intercept values correspond to the depth of the crack at the time the measured values were obtained.