Apparatus for testing integrated circuit

Abstract

An apparatus for testing plug-in type integrated circuits by applying a potential across their input and output terminals, utilizing a socket board with a plurality of sockets bored therein to receive respective input and output terminals of an integrated circuit. A pair of first and second groups of fixed contacts are located in the socket board, arranged in two concentric circles enclosing the sockets. Each fixed contact in each group is individually connected to one of the sockets through a conductor. A pair of coaxial first and second moving contact pins is rotatably disposed below the socket board. The first contact pin rotates to follow the first circle while sequentially contacting the contacts of the first group. The second contact pin follows the second circle, making sequential contact with the fixed contacts of the second group. It is so arranged that, when both contact pins are brought into contact with a selected pair of contacts from the two groups, one contact pin connects an input terminal while the other contact pin connects an output terminal, or vice versa, of the integrated circuit mounted on the socket board. In doing so, the contact pins pass current across the output and input terminals for a test.