The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 1987

Filed:

Mar. 17, 1986
Applicant:
Inventor:

Robert T Eichberger, Mt. Clemens, MI (US);

Assignee:

Berwind Corporation, Philadelphia, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01G / ; G01R / ;
U.S. Cl.
CPC ...
7330 / ; 73 / ; 324 / ;
Abstract

A system for indicating the level of material in a vessel as a function of material capacitance comprising a resonant circuit including a capacitance probe adapted to be disposed in a vessel so as to be responsive to variations in capacitance as a function of material level. An rf oscillator has outputs coupled to the resonant circuit and to a phase detector for detecting variations in phase angle as a function of probe capacitance. Level detection circuitry is responsive to an output of the phase detector and to a reference signal indicative of a predetermined level of material for indicating material level as a function of a difference between capacitance at the probe and the reference signal. An automatic calibration circuit adjusts the resonance characteristics of the parallel resonant circuit. A remote module provides facility for initiating a system-test and a system-calibrate operation, either individually or sequentially.


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