The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 1987
Filed:
Oct. 05, 1979
Fernand R Loy, Sceaux, FR;
Abstract
The invention relates to a device for optically scanning a field of vision divided into different regions and for displaying the field, scanning being done in two perpendicular directions, i.e. 'line' scanning in a direction x and 'raster' or 'image' scanning in a direction y, the device scanning along beams coming from different regions of the field and causing the beams to converge on to an element sensitive to the radiation in the beams, the present invention being concerned particularly with the line-scanning means, which is designed so that the device can operate with smaller apertures without affecting its resolution. The line-scanning system comprises a rotating drum having reflecting surfaces but the detector image is conveyed outside the drum axis. The analyzed line is an arc of a circle but is centered outside the drum axis and its length is greater than before whereas the aperture of the line analysis system is smaller so that if the system of analysis has a given geometrical size, the number of points of analysis in the line is at least preserved. Consequently, the device can be constructed with a smaller aperture--i.e. F/4 instead of F/2--resulting in greater tolerance in faults in the focusing of the raster mirror.