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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 4674028 B1

PDFFull Text
Date of Patent:
Jun. 16, 1987

Filed:

Jan. 16, 1985

Identification method of a process parameter

Applicant:
Inventors:

Makoto Shioya, Tokyo, JP;

Teruji Sekozawa, Kawasaki, JP;

Motohisa Funabashi, Sagamihara, JP;

Masahiro Ishida, Katsuta, JP;

Hiroatsu Tokuda, Katsuta, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:

Antonelli, Terry & Wands

Primary Examiner:

Joseph Ruggiero

Int. Cl.
CPC ...
G05B / ;
U.S. Cl.
CPC ...
364148 ; 364157 ; 364194 ;
Abstract

A calculation unit for calculating a gain matrix from process input and output information and a calculation unit for calculating a parameter estimation have an independent weight setting unit. A weight W.sub.i (k+1) is set at a current time point while taking into consideration of an affect of square of residual e.sup.2 (i) in each time step between an initial time step (i=1) to the current time step (i=k+1), and a parameter is estimated in accordance with an evaluation index ##EQU1##

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Shioya, Makoto. (1987). Identification method of a process parameter (U.S. Patent No. 4674028). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4674028

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