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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 4673879 B1

PDFFull Text
Date of Patent:
Jun. 16, 1987

Filed:

Jun. 27, 1984

Eddy current flaw detector having rotatable field defining sleeve for

Applicant:
Inventors:

Richard M Harris, North Royalton, OH (US);

David A Valek, Parma, OH (US);

James M Toth, Lyndhurst, OH (US);

Richard F Abramczyk, Brunswick, OH (US);

Assignee:

Rupublic Steel Corporation, Cleveland, OH (US);

Attorney:

Watts, Hoffmann, Fisher & Heinke Co.

Primary Examiner:

Reinhard J Eisenzopf

Assistant Examiner:

Warren S Edmonds

Int. Cl.
CPC ...
G01N / ; G01N / ; G01R / ;
U.S. Cl.
CPC ...
324240 ; 324238 ; 324237 ; 324262 ; 336 / ;
Abstract

Method and apparatus for scanning a generally cylindrical workpiece for flaws. A cylindrical metallic sleeve is rotatably supported about a workpiece path of travel. Two differentially wound energization coils surround the sleeve near two apertures in the sleeve. The coils are energized with a high frequency signal that induces eddy currents in the workpiece. The apertures periodically disrupt the eddy current inducing magnetic fields and enhances signals from the coils indicative of the presence of flaws in the workpiece.

Find Patent Forward Citations

Harris, Richard. (1987). Eddy current flaw detector having rotatable field defining sleeve for (U.S. Patent No. 4673879). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4673879

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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