The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 1987

Filed:

Feb. 28, 1986
Applicant:
Inventors:

Isao Horiba, Kariya, JP;

Akira Iwata, Nagoya, JP;

Nobuo Suzumura, Aichi, JP;

Hiroshi Matsuo, Toyonaka, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
378 62 ; 378-9 ; 378 22 ; 378901 ; 364414 ;
Abstract

An object is irradiated with respective cone-beam like X-rays from first and second directions. For each of the first and second directions are produced mask and live images as respective projection images of the object before and after a contrast medium reaches an interested part of the object. Then, subtraction of the mask image from the live image is made in conjunction with each of the first and second directions. The resulting subtraction image assumes a projection image of the distribution of the contrast medium in the interested part taken in the corresponding direction. The respective projection widths of such projection images of the contrast medium distribution are determined to generate an ellipse defined by the projection widths. The shape of this ellipse is corrected in accordance with individual data values in the projection images of the contrast medium, thereby providing a corrected shape accurately resembling the actual shape of the interested part of the object. The corrected shape of the interested part is displayed.


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