The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 1987

Filed:

May. 28, 1985
Applicant:
Inventors:

Yasumasa Nishimura, Itami, JP;

Kazuyasu Fujishima, Itami, JP;

Masaki Kumanoya, Itami, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C / ;
U.S. Cl.
CPC ...
365201 ; 365189 ;
Abstract

A semiconductor device is provided which can be efficiently subjected to a function test at a high speed by write/read operations for each plurality of bits. The semiconductor device according to the present invention comprises an encoder for encoding a 1-bit signal to a signal of a plurality of bits and a decoder receiving a signal of a plurality of bits for decoding the same to a 1-bit signal in response to the states thereof, so as to simultaneously write each bit of the plurality of bits from the encoder in each corresponding memory cell of a plurality of simultaneously selected memory cells in a writing test mode, and to simultaneously read information signals stored in the plurality of simultaneously selected memory cells in a reading test mode thereby to decode the signals to a 1-bit signal corresponding to the plurality of information signals.


Find Patent Forward Citations

Loading…