The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 1987
Filed:
Nov. 05, 1985
Mark P Claypool, Horseheads, NY (US);
Patrick T Battersby, Elmira, NY (US);
Emhart Industries, Inc., Farmington, CT (US);
Abstract
Method and apparatus for optical inspection of transparent layers such as the wall of glass and plastic containers, using bifurcated fiber optic probes. One or more of such fiber optic probes are directed at the wall of a transparent container, and light emitted thereby is selectively reflected from both the inner and outer surfaces of the container wall. Each probe includes a pair of bifurcated fiber optic bundles which are disposed at different distances behind a 1:1 lens system, resulting in two focal points at different distances from the fiber optic probe. Relative motion of the inner and outer wall surfaces between these focal points results in measurable variations of the probe output signals, which variations may be interpreted to track wall thickness and concentricity. An alternative detection scheme uses a probe with a single bifurcated bundle, and reciprocates such probe relative to the container wall while measuring the separation of null points of the output signal.