The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 1987

Filed:

Oct. 15, 1985
Applicant:
Inventors:

Teruo Fujita, Kyoto, JP;

Keizo Kono, Kyoto, JP;

Mitsushige Kondo, Kyoto, JP;

Shinsuke Shikama, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ; G01J / ; H01J / ;
U.S. Cl.
CPC ...
250201 ; 2502 / ; 369 45 ;
Abstract

A focusing error detecting device used in a head assembly for recording information to a recording surface of an optical disc or reading out information already recorded, the focusing error detecting device including a diffraction grating for focusing light which has been introduced from a light source into a thin-film waveguide layer, onto the recording surface, and two light receiving diffraction gratings for conducting the light reflected by the recording surface again into the waveguide layer. The two light receiving diffraction gratings have optical characteristics which differ from each other, depending the position of a focused spot of the light focused on the recording surface by the focusing diffraction grating. Therefore, by comparing the intensity of light from one light receiving diffraction grating with that from the other light receiving diffraction grating, there can be seen a positional relationship between the focused spot and the recording surface.


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