The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 1987
Filed:
Jun. 18, 1985
Joseph E Zupanick, Richardson, TX (US);
Carl D McBride, Garland, TX (US);
Atlantic Richfield Company, Los Angeles, CA (US);
Abstract
The present invention provides a radiometer for simultaneously detecting luminescence and reflectance about a particular Fraunhofer line from a material (i.e. target) which includes an interchangeable optical filter assembly of lightweight construction for each Fraunhofer line of interest which substantially alleviates the adverse polarization effects normally experienced in radiometers of this type and which further provides an improved balance between the two light beams being sensed by the radiometer. The optical filter assembly includes a single beamsplitter which reflects the majority of the light from the target with little adverse polarization effects to a narrow band filter which passes only the light existing at the particular Fraunhofer line (i.e. 'c' component of luminescence). The remaining smaller fraction of the light passes through the beamsplitter with only slightly greater polarization to a broad band filter which, in turn, passes only the light in the continuums adjacent the Fraunhofer line (i.e. 'd' component of luminescence). The intensity of the light from the narrow and broad band filters are measured for use in calculating the luminescence and reflectance emanating from the target.