The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 1987
Filed:
Dec. 24, 1984
Applicant:
Inventor:
Yoshikazu Hazuki, Tokyo, JP;
Assignee:
Kabushiki Kaisha Toshiba, Kawasaki, JP;
Primary Examiner:
Int. Cl.
CPC ...
H01L / ; H01L / ;
U.S. Cl.
CPC ...
2957 / ; 29591 ; 148D / ; 148D / ; 427 91 ;
Abstract
A method of forming a multilayer interconnection for a semiconductor device comprising a first insulation layer deposited on a substrate having semiconductor elements, first interconnection patterns, a second insulation layer interposed between the first interconnection patterns, a third insulation layer covering the first interconnection patterns and second interconnection patterns contacted with the first interconnection patterns, wherein the first interconnection patterns are formed in such a manner by vapor phase growth process that the first interconnection patterns cover both edges of the interposed second insulation layer.