The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 1987
Filed:
Jun. 12, 1985
Brett A Spivey, Encinitas, CA (US);
Western Research Corporation, San Diego, CA (US);
Abstract
A wavefront, such as from a laser, is sampled, preferably at a beam splitter to break off only a fraction of the total light energy. The sampled beam is adjusted and sized--either by expansion or contraction at a conventional telescope--and thereafter sent through paired crossed Ronchi gratings and onto a CCD camera located at the first wave distance of constructive interference from the crossed Ronchi gratings. The crossed Ronchi gratings--in the order of 200 lines per inch and preferably with 200 equally spaced gaps per inch--project an array of square spots onto the focus of the CCD camera. The image of the array of square spots at the CCD camera is frozen via a frame grabber and digitized in a conventional format. The digitized image is played through a disclosed computer program to locate the spots. Thereafter, the located spots are compared to a standard spots. By knowing the difference between spot location of the standard spots and spot location of the suspect spots, wavefront analysis in phase can be analyzed. There results a simple wavefront analysis without the use of precision and moving optical parts which provides for measurement of the wavefront.