The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 1987
Filed:
Jan. 27, 1986
Yasuo Koseki, Hitachiohta, JP;
Katsuya Ebara, Mito, JP;
Sankichi Takahashi, Hitachi, JP;
Kazuhiko Matsuoka, Takasaki, JP;
Minoru Kuroiwa, Abiko, JP;
Akira Yamada, Hitachi, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
An impurity detector atomizes a liquid sample by injecting the sample into a chamber with a gas. In the chamber the liquid is heated, preferably by heating the gas prior to injection, to cause all the liquid to evaporate. The solid impurities contained in the liquid are thus entrained in the gas and carried to a detector region. The chamber is arranged so that all the gas and all the particles arrive at the detector region. A particle detector measures the number and size of the particles and from that measurement, the concentration of impurities in the sample can be determined. The system permits on-line operation, and produces accurate results.