The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 1987

Filed:

Jul. 14, 1986
Applicant:
Inventors:

Ichiya Sato, Hitachi, JP;

Takao Yoneyama, Katsuta, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73660 ;
Abstract

Disclosed is a rotating machinery diagnosis system with an AE technique, which comprises: an AE sensor mounted on a rotary machine for sensing an acoustic signal of the rotary machine; envelope detector means for obtaining an envelope signal from the acoustic signal from the AE sensor; waveform-feature processor means for performing signal processing so as to detect a feature of waveform of an output waveform signal from the envelope detector means; feature decision means for judging whether the feature of waveform belongs to a continuous type or a burst type and/or to a rotation-synchronous type or a rotation-asynchronous type on the basis of an output signal from the waveform-feature processor means; and diagnostic output means for outputting and displaying an output signal from the feature decision means, whereby it is possible to perform judgement simultaneously as to a plurality of kinds of abnormality.


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