The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 1987
Filed:
Oct. 09, 1985
Erik W Anthon, Santa Rosa, CA (US);
Optical Coating Laboratory, Inc., Santa Rosa, CA (US);
Abstract
Scattermeter for evaluating the surface quality of an optical element made from a material that has bulk scattering of light by measuring the light scattering from the surface while disregarding the bulk scatter, with the surface scatter being distinguished from the bulk scatter by their different polarization characteristics. The scattermeter is comprised of an illuminator optic providing an intense, substantially collimated light beam with a controlled variable state of polarization illuminating a defined area of the surface of said optical element. It is also comprised of a collector optic with a controlled field of view limited to an area substantially equal to the area illuminated by said illuminator optic, a polarization sensitive optical modulator, a photoelectric detector, a demodulating amplifier, and a readout device.