The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 1987

Filed:

May. 01, 1985
Applicant:
Inventor:

John S Baer, Bar Harbor, ME (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L / ; G01L / ;
U.S. Cl.
CPC ...
73386 ; 73DI / ; 73337 ; 73728 ; 73729 ; 73735 ; 73779 ; 338 / ; 338 42 ;
Abstract

Parameter sensors and monitors are described incorporating one of a variety of parameter responsive structures constructed and arranged for expansion and contraction causing a component of motion and displacement along at least one direction in response to variations of a selected parameter. A reference mounting supports the parameter responsive structure and either a magnet element or Hall effect transducer is secured relative to the reference mounting or housing in alignment with a selected direction of a component of motion and displacement caused by expansion and contraction of the parameter responsive structure. The other of said magnet element and Hall effect transducer is mounted for relative displacement along said selected direction in response to expansion and contraction of the parameter responsive structure. The magnet element and linear Hall effect transducer are juxtaposed relative to each other for variable spacing in response to changes in the selected parameter by expansion and contraction of the parameter responsive structure. An HET enhancer in the form of a magnet receiver sleeve of magnetically permeable material enhances the linearity and sensitivity of the HET voltage response to magnet element displacement. The invention is applied by way of example to barometers, altimeters, hygrometers, pressure gauges and force gauges using parameter responsive structures such as ambient pressure responsive bellows and capsules, ambient humidity responsive tubes or hollow cylinders of hydroscopic material, Bourdon tubes and pressure tubes of various configurations, and force gauge proving rings.


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