The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 1987

Filed:

Dec. 20, 1984
Applicant:
Inventors:

Mark S Young, Mountain View, CA (US);

John Drew, Los Gatos, CA (US);

Michael C Shebanow, Berkeley, CA (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ; G06F / ;
U.S. Cl.
CPC ...
371 40 ; 371 38 ;
Abstract

A method and apparatus for generating a check sum and a syndrome for detecting errors in a series of bytes comprising a plurality of stages, each stage comprising a plurality of networks of exclusive OR gates, a memory and an exclusive OR gate for exclusively ORing the outputs of the networks resulting from a byte transmitted therethrough with the results stored in a memory in a previous stage due to a previous byte. Each of the stages and the networks therein correspond to a term in a Reed-Solomon polynomial. Except for differences in the number and construction of the networks in each stage, each of the stages are substantially identical and can be selectively used for detecting single and double burst errors.


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