The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 1987
Filed:
May. 14, 1985
Masayoshi Hatanaka, Iwaki, JP;
Tadayuki Uekita, Iwaki, JP;
Kureha Chemical Industry Company, Ltd., Tokyo, JP;
Abstract
A material testing apparatus including holders for material to be tested, a driving unit actuating the holders to plastically deform the material and a measuring unit for measuring the extent of color changes in deformed material. The measuring unit, which is an essential part of the apparatus, includes a light source, a light beam receiving unit and a display device. Light beams emitted from a light source are reflected on the plastically deformed material in the form of a testpiece, and thus reflected light beams are introduced into the light beam receiving unit in which the intensity of the received light beam is detected. Then, the light beams are converted into an electrical value, and digitally displayed on the display device. The driving unit may include a mechanism for changing the rate of deformation of the material. The material is usually subjected to plastic deformation by a stepping motor which changes the rate of deformation of the material. The driving unit may further include a plurality of speed reduction gears which can be replaced as required so as to change the rate of deformation of the material over a wide range. The driving unit also includes a mechanism for bending and stretching the testpieces.