The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 1987

Filed:

Apr. 29, 1985
Applicant:
Inventors:

Michio Itoh, Kokubunji, JP;

Isao Ishikawa, Hino, JP;

Motoko Yoshida, Chofu, JP;

Kazunori Okano, Shiki, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
2042 / ; 2041821 ; 2041828 ; 2041829 ;
Abstract

This invention relates to an apparatus for two-dimensional electrophoresis which comprises a supporting plate fixed to a rotary axis, a support for first dimension electrophoresis disposed on the supporting plate and a support for second dimension electrophoresis disposed on another supporting plate. Both the supports are arranged in such a fashion that when the rotary axis is rotated, the support for the first dimension electrophoresis comes on the support for the second dimension electrophoresis or reaches a predetermined position in the support for the second dimension electrophoresis. This arrangement can shift the support for the first dimension electrophoresis to the support for the second dimension electrophoresis without damaging the former.


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