The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 1987
Filed:
Mar. 29, 1985
Yoshiyuki Shimizu, Miura, JP;
Takashi Mori, Miura, JP;
Nippon Kogaku K. K., Tokyo, JP;
Abstract
A microscope objective lens which, in spite of having a great numerical aperture and a high magnification, can always maintain an excellent imaging performance even if the thickness of a parallel flat plate such as a cover glass disposed between the object surface and the objective lens is greatly varied. The microscope objective lens has, in succession from the object side, a first lens group of positive refractive power for converting the light flux from an object into a convergent light flux, the first lens group having a positive meniscus lens component with its concave surface facing the object side and having a cemented lens component, a second lens group having a cemented lens component of negative refractive power disposed in the convergent light flux, and a third lens group of negative refractive power having a meniscus lens component with its convex surface facing the object side and having a succeeding negative lens component. The second lens group is movable on the optical axis relative to the first and third lens groups to correct deterioration of imaging performance due to variation in thickness of the parallel flat plate.