The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 1987

Filed:

Sep. 20, 1985
Applicant:
Inventor:

Gerhard Huschelrath, Laufach, DE;

Assignee:

NUKEM GmbH, Hanau, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73611 ; 73597 ;
Abstract

The invention relates to a method and a device for measuring the wall thickness of bodies by means of ultrasonic pulses. The ultrasonic pulses are created in the bodies and reflected on the walls. The transit times of the ultrasonic pulses reflected on the walls are measured. The wall thickness is determined from the transit times by considering the respective sonic speed in the body. The measured signals obtained with a receiver are each compared with a threshold value that is set to a low base value (17a) at the beginning of the measurement. With each measured signal exceeding the associated threshold value (17a, 17b, 17c, 17d respectively) the threshold value is reset to the amplitude of the measured signal. The times from a specified starting time are measured up to the measured pulses that exceed the threshold values. The maximum value of the time corresponds to the transit time of the back wall echo (13).


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