The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 1987
Filed:
Dec. 26, 1985
Applicant:
Inventor:
Jacobus P Heemskerk, Eindhoven, NL;
Assignee:
U.S. Philips Corporation, New York, NY (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
250201 ; 369 45 ;
Abstract
An apparatus is described for optically scanning an information surface (2). The apparatus comprises a radiation source (4), an objective system (6) and, arranged between them, a diffraction grating (9) for separating the beam reflected by the information surface from the beam (5) emitted by the source and for splitting the reflected beam into two sub-beams (5a, 5b). For each sub-beam there is provided an associated detector pair (16, 17; 18, 19). The grating (9) comprises two sub-gratings (11 and 12) whose grating lines (13, 14) are disposed at opposite angles to the bounding line (26) of the sub-gratings.