The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 1987

Filed:

Sep. 20, 1985
Applicant:
Inventors:

Gianni Coppa, Asti, IT;

Pietro Di Vita, Turin, IT;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G02B / ;
U.S. Cl.
CPC ...
356 731 ; 35016212 ;
Abstract

The refractive-index value is obtained by radially scanning a near-field image of the fiber output face and by computing, for each image point, the ratio between a first intensity value, obtained in the presence of a mask, having a transmissivity proportional to the fourth power of the transversal beam coordinate and located in a far-field plane, and a second intensity value, obtained in the absence of such a mask. An automated measurement apparatus for implementing the method is also provided.


Find Patent Forward Citations

Coppa, Gianni. (1987). Method of and apparatus for the measurement of the refractive-index (U.S. Patent No. 4664516). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4664516

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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