The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 1987

Filed:

Nov. 08, 1985
Applicant:
Inventors:

T Alan Hatton, Cambridge, MA (US);

Joel L Plawsky, Boston, MA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356336 ; 250227 ; 250574 ; 356338 ;
Abstract

A system for the simultaneous measurement of the size and velocities of bubbles or drops in a multiphase process environment wherein light passing through a Ronchi grating is projected onto a measurement volume within the multiphase process stream by a coherent fiber optic bundle and a gradient index imaging lens. Drops or bubbles passing through the measurement volume reflect or refract light which is sensed by velocity and size sensor fiber optic bundles disposed opposite the imaging lens and the sensed signal is coupled to signal processing means which convert the light signal to electrical signals and the appropriate size velocity measurments are made using one or more of the visibility techniques, phase lag techniques or transit time techniques.


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