The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 1987

Filed:

May. 18, 1984
Applicant:
Inventor:

Edward H Adelson, Princeton, NJ (US);

Assignee:

RCA Corporation, Princeton, NJ (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382 41 ; 382 17 ; 382 49 ; 358227 ;
Abstract

An improved-focus 2-D image is derived from an assemblage of M separately focused 2-D images of the same 3-D scene by (1) employing the Burt Pyramid image analyzing technique to separately analyze each of the M separately focused images into N similar sets of pixel samples, (2) selecting, on a pixel-by-pixel basis from each group of M corresponding sets of the assemblage, the best focused pixel, to derive a single analyzed image of N sets of improved-focus pixels, and (3) employing the Burt Pyramid image synthesizing technique to synthesize the improved-focus 2-D image from the single analyzed image of N sets.


Find Patent Forward Citations

Adelson, Edward. (1987). Depth-of-focus imaging process method (U.S. Patent No. 4661986). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4661986

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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