The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 1987
Filed:
Jul. 15, 1985
Donald W Kormos, Parma, OH (US);
Hong-Ning Yeung, Richmond Heights, OH (US);
Henry S Dewhurst, Cleveland Heights, OH (US);
Technicare Corporation, Solon, OH (US);
Abstract
In an NMR system, two chemical shift components are separated by correcting NMR data for field inhomogeneity. A first image data set is acquired which contains no chemical shift information or field inhomogeneity. A second image data set is acquired which contains both chemical shift information and field inhomogeneity. A third image data set is acquired which contains field inhomogeneity information. The first and third image data sets are combined to identify the field inhomogeneity information. This intermediate field image is then used to correct the second image data set for field inhomogeneity. The first image data set and corrected second image data set may then be combined by magnitude reconstruction of complex sums and differences to separate the two chemical shift components.