The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 1987

Filed:

Aug. 17, 1984
Applicant:
Inventor:

Kevin A Muething, Hillsborough Township, Somerset County, NJ (US);

Assignee:

AT&T Technologies, Inc., Berkeley Heights, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ; G01B / ;
U.S. Cl.
CPC ...
356357 ; 356345 ; 356355 ;
Abstract

An apparatus for automatically measuring the depth and rate of etching of a semiconductor body (10) comprises an interferometer (18) and a counter circuit (28). The interferometer (18) directs light towards the semiconductor body (10) and detects the intensity of the light reflected therefrom which varies periodically during etching. The counter circuit (28) is responsive to the periodically varying intensity of the reflected light and automatically determines the number of cycles and the frequency thereof to compute the etch depth and etch rate therefrom.


Find Patent Forward Citations

Muething, Kevin. (1987). Method and apparatus for automatically measuring semiconductor etching (U.S. Patent No. 4660979). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4660979

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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