The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 1987

Filed:

Feb. 21, 1984
Applicant:
Inventors:

Takeshi Yoshimoto, Kyoto, JP;

Masanari Tsuda, Kyoto, JP;

Yoshikazu Masuda, Osaka, JP;

Masakatsu Yokoi, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
358285 ; 358227 ; 358289 ; 358293 ; 358292 ; 355 55 ; 250201 ; 250578 ;
Abstract

A method for obtaining a desired picture with high quality by scanning a rotating recording drum by a scanning light beam, which produces images on the drum through a projection lens, receiving the said images being reflected from the drum through the projection lens on an image sensor, detecting variations of diameter of the drum per each rotation from variations of intensity of light of the images, whereby position of the projection lens being movable along the normal direction of the drum is automatically adjusted against machining errors of the drum diameter and variations of the said diameter caused by changes of its surrounding or any other reasons, temperature, so that variations of imaging points of the scanning light beam can always be within a range of depth of a focus of the projection lens.


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