The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 1987
Filed:
Nov. 12, 1985
Paolo Cielo, Montreal, CA;
Ghislain Vaudreuil, Boucherville, CA;
Canadian Patents and Development Limited, Ottawa, CA;
Abstract
An apparatus using optical techniques for simultaneously detecting surface defects and measuring the diameter of a wire coming out from an extruder. A combination of cylindrical lenses is used for projecting, perpendicularly across the longitudinal axis of the wire, a sharply focused laminar beam. This apparatus includes an optical source system for emitting optical rays, an optical system for focusing the rays on the wire, an optical detector system for receiving the rays and generating a detector signal to be processed by a signal processing system, the processing system generates an electric signal indicative of the amplitude of the defects and another electric signal indicative of the diameter of the wire.