The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 1987
Filed:
Jun. 29, 1984
Applicant:
Inventors:
Oscar C de Leon, Jr, Hialeah, FL (US);
Philip F Kromer, III, Winchester, MA (US);
Assignee:
Racal Data Communications Inc., Miami, FL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324 / ; 324 / ; 324102 ;
Abstract
A noninterruptive noise measurement technique wherein the absolute value of the amplitude error from a modem slicer is compared to a reference, the number of events in excess of said reference over a selected interval are counted and the range within which said count falls is determined as a particular signal to noise ratio value.
Quick Actions:
de Leon, Jr, Oscar. (1987). Noninterruptive noise measurement (U.S. Patent No. 4658210). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4658210
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