The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 1987
Filed:
Feb. 15, 1985
Kazuyuki Koike, Nishitama, JP;
Kazunobu Hayakawa, Chofu, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
The present invention relates to a scanning electron mircoscope suitable for observing the magnetization condition of the portion of a magnetic material which is in the vicinity of the surface thereof. This microscope consists of means for emitting a fine electron beam to the upper surface of a sample, means for scanning the sample surface with the fine electron beam, means for collecting secondary electrons from the sample, means for detecting a spin polarization vector of the collected secondary electrons, means for converting a component, which is in an arbitrary direction in the surface of the sample, and/or a component, which is in the normal direction of the surface of the sample, of the detected polarization vector into a picture signal which is representative of an image obtained through the scanning electron microscope, and means for indicating the picture image on a display.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile