The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 1987
Filed:
Jun. 10, 1985
Applicant:
Inventor:
Albert Brunsting, Elkhart, IN (US);
Assignee:
Miles Laboratories, Inc., Elkhart, IN (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
356418 ; 350315 ; 356419 ;
Abstract
Simultaneous multiple photometer measurements are made by simultaneously passing light to be measured through multiple light paths to different locations of a circularly variable filter; passing the light through the circularly variable filter at said locations; collecting the light passed through the circularly variable filter at each location; transmitting the light passed through the circularly variable filter to separate detectors; and measuring the light transmitted along each light path by said detectors.
Brunsting, Albert. (1987). Simultaneous multiple wavelength photometer (U.S. Patent No. 4657398). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4657398
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile