The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 1987
Filed:
Mar. 22, 1985
Maschinenfabrik Rieter AG, Winterthur, CH;
Abstract
An arrangement for evaluating the performance of a yarn processing machine including a plurality of yarn processing stations that are individually operatable and each of which includes a monitoring device for the operating conditions thereof and a yarn quality monitoring device capable of detecting yarn quality defects comprises data links which separately supply first signals from the condition monitoring devices and second signals from the yarn quality monitoring devices to an evaluation location. An associating device is situated at the evaluation location, being connected to the data links and operative for associating the second signals which are representative of quality defects with the associated yarn processing stations. The associating device includes two storage devices one of which stores data representative of random yarn breaks at the associated stations while the other stores data representative of quality defects at such stations, and there is further provided an arrangement for entering data into the storage devices in response to those of the second signals which are representative of defective yarn quality at the associated stations, and to those of the first signals which are representative of changes in the conditions of the associated stations that are indicative of yarn breaks at such stations.