The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 1987

Filed:

Nov. 28, 1984
Applicant:
Inventors:

Takaki Shimura, Machida, JP;

Keiichi Murakami, Kawasaki, JP;

Yutaka Igarashi, Yokohama, JP;

Akira Shiba, Kawasaki, JP;

Hajime Hayashi, Yamato, JP;

Hirohide Miwa, Kawasaki, JP;

Michitoshi Inoue, Osaka, JP;

Masayuki Matsumoto, Ashiya, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
128660 ; 73602 ;
Abstract

A diagnosis apparatus for discriminating a property of the tissue to be observed from the reflected ultrasonic wave uses the nature of the fine structure of the tissue, and more practically uses the interval of small reflecting bodies dispersely distributed in the tissue as the parameters. The intervals flucatuate. Therefore, an average value and/or a degree of fluctuation is calculated and is displayed. For obtaining the average interval, a method of using the cepstrum of the received signal or a method of using the self-correlation of the received signal can be used.


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