The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 1987

Filed:

Jul. 19, 1984
Applicant:
Inventors:

Klaus Becker, Stuttgart, DE;

Albrecht Muller, Stuttgart, DE;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F / ; G01S / ;
U.S. Cl.
CPC ...
364571 ; 342174 ;
Abstract

The time required for several calibration signals to traverse a signal path (1, 2, 3) is determined and compared with a nominal value. The individual calibration signals have different values for at least one signal parameter. Depending on the results of the comparison, a control signal is produced for each value of the signal parameter. Of the intelligence signal, the value of the signal parameter to be taken into account in the determination of the control signal is measured prior to the traversal of the signal path, and the control signal assigned to this value is selected. The control signal can be used in DME transponders to set an exact transponder delay, and in DME interrogators to allow for delay variations in the distance measurement.


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Becker, Klaus. (1987). Facility for determining delay variations (U.S. Patent No. 4654810). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4654810

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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