The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 1987
Filed:
Oct. 09, 1984
Curtis Birnbach, Bronx, NY (US);
Jay Tanner, Nesconset, NY (US);
Quantum Diagnostics Ltd., Hauppauge, NY (US);
Abstract
Objects to be examined, such as tissue or any cellular or crystalline material, e.g. semiconductor wafers, are placed in a region of confluence of two interfering coherent beams of radiation which are at the same frequency and phase and at a frequency to which the object is semi-transparent. The beams are produced by separate sources or by refraction by a Fresnel biprism or any other interferometer structure. An off-axis parabolic reflection system is also disclosed. The interference fringe phase and amplitude perturbation produced by the object is detected and examined to derive information regarding physical properties of the object or abnormalities in its structure. Such abnormalities, as fractures or latent stresses in a semi-conductor wafer or the presence of tumors in biological tissue can be determined. Chemical characteristics of living tissue is determined by sweeping the frequency of the coherent radiation over a band which includes the absorption bands of given chemicals such as hydrogen, oxygen, sodium, and other materials which are representative of the structure of living tissue. The frequencies employed may be in the microwave band, millimeter band or higher.