The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 1987
Filed:
Jan. 24, 1984
Takeji Nishimura, Kawasaki, JP;
Mitutoyo Mfg. Co., Ltd., Tokyo, JP;
Abstract
A method for indicating measured value data of a measuring instrument, in which the measured value data of a workpiece to be measured is measured by a measuring instrument, such as slide calipers and the data indicated histogrammatically. There are present divided sections obtained by evenly dividing a set range of a measured value by a divisor, judging which divided section each of the measured value data, which has been successively taken in, belongs to, and storing the frequencies of measurement of the measured value data. The frequencies of measurement thus stored are divided by a predetermined weight coefficient to obtain a quotient, and the aforesaid divided sections are printed histogrammatically as marks representing minimum integers larger in value than the quotient, with the maximum value of variability having a value suitable for being received in the maximum indication places, so that the mean value, variability and the like of the measured values can be readily recognized.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile