The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 1987
Filed:
Oct. 18, 1985
Louis G Alster, Morton, IL (US);
Chester S Gardner, Champaign, IL (US);
Caterpillar Inc., Peoria, IL (US);
Abstract
An apparatus and method for measuring the profile of a curvilinear surface is provided. The apparatus includes a light source for substantially uniformly delivering radiant energy along an illumination plane substantially tangent to the curvilinear surface. The delivered radiant energy is optically imaged at a first image plane. A first portion of the delivered radiant energy is blocked by an optical field stop having an accurately straight reference profile edge portion, and a second portion of the imaged radiant energy is focused on a transducer located at a second image plane. The transducer produces a coded data signal in response to the focused radiant energy. A microprocessor receives the coded data signal, determines the deviation of the profile of the curvilinear surface from the reference profile edge portion, and produces a straightness signal in response to the determined deviation. Nonuniformities of the apparatus are automatically compensated for. The apparatus is simple to operate and facilitates 100% inspection in a production environment.